Product Detail

XRF Analyzer EA1400 Hitachi Japan The newly developed silicon drift detector (SDD) High sensitivity and high throughput measurement New detector with increased quantum efficiency in the high energy region, making high-sensitivity, high-throughput measurement of the Cd Kα, Pd Kα, Ba Kα energy bands possible. Higher resolution and higher count rate Compared to previous models (EA1200VX [see graph] or EA1000VX) EA1400 excels in detecting trace elements adjacent to the main components of the sample thanks to its high-resolution, high-count rate SDD which allows for exceptional performance in tasks such as quality control of metals and others. Vacuum System and New SDD The sensitivity of light elements is greatly improved by using the new detector and vacuum system, which aids in process and quality control of slag and cement. From RoHS control to an extensive range of areas RoHS: Screening of Cd in brass made faster More than doubled the throughput when measuring traces of Cd in brass and other metals compared to our previous model (EA1000VX.) Lower limit of detection (mg/kg) of every element in brass from a 300 sec. measurement Element Cd Pb Cr Lower Limit of Detection 4 13 11 *Shown data is an example, not to be considered guaranteed performance. Control process in smelting: fast, accurate measurement of main elements in slag Smelting process conditions are controlled using the information from slag’s major components; Si, Ca, Al, Mg. The new SDD provides considerable improvement in accuracy with light elements, like Mg, in particular. Quality control: detection of adhered, buried foreign matter With X-ray diagonal irradiation system, it has been difficult to measure samples with uneven or irregular surface and contaminants adhered to the base material. The EA1400, equipped with optimized X-ray irradiation and sample observation mechanism, enables detecting and identifying elements originating from contaminants. Specifications: Mode; EA1400 Measurable elements Na(11)～U(92) Environment Normal atmosphere (Al～U) Vacuum (Na～U) *Optional X-ray direction X-Ray Vertical Irradiation (Coaxial Sample Observation) X-ray source Small Air-cooled x-ray tube (Rh target) Detector Newly developed Silicon Drift Detector (SDD) Measurement Area 1,3,5 mmφ Filter 5 filters automatic switching Sample chamber 304(W)×304(D)×110(H)mm Weight 69 kg Power requirements AC100～240V (50/60Hz)/190VA Sample changer Compatible (12samples) *Optional